NI PX1-6542 PXI Digital Waveform Instrumentation

NI PXI-6542 Overview

The NI PXI-6542 is a PXI digital waveform instrument used for digital waveform generation and analysis. It interfaces with 32 single-ended digital pins and is suitable for various digital test applications.

Product Detailed Description

• Function:

• Generates and analyzes digital waveforms.

• Interfaces with 32 single-ended digital pins.

• Supports sampling rates up to 100 MHz.

• Features:

• Capable of sampling digital waveforms at rates up to 100 MHz.

• Interfaces with common transistor-transistor logic (TTL) voltage levels.

• Features advanced synchronization capabilities for building integrated mixed-signal test systems.

• Digital waveform editor allows users to import, edit, and create waveforms.

• Can be used with NI LabVIEW, LabVIEW SignalExpress, and C.

Product Parameters

• Number of Channels:

• 32 single-ended digital pins.

• Sampling Rate:

• Up to 100 MHz.

• Voltage Levels:

• TTL.

• Features:

• Synchronization capabilities.

• Digital waveform editor.

• For detailed parameters, please refer to the official NI product manual.

Product Advantages

• High Sampling Rate:

• Meets the needs of high-speed digital testing.

• Flexible Synchronization:

• Facilitates building complex test systems.

• Software Integration:

• Seamless integration with software like NI LabVIEW, improving development efficiency.

• Multiple memory models:

• Available in 1,8, and 64 Mbit/channel memory models, providing users with different choices.

Precautions

• Correct Installation:

• Follow NI's installation guidelines.

• Environmental Conditions:

• Ensure the working environment meets product specifications.

• Cable Connections:

• Properly install cables to avoid equipment damage.

• Electrostatic Discharge (ESD) Protection:

• Take ESD precautions to avoid damaging electronic components.

• Product Obsolescence:

• This product has been marked as obsolete by NI, verify availability before purchase.

Product Applications

• Digital Testing:

• Used for testing digital circuits and systems.

• Mixed-Signal Testing:

• Used with other test instruments to build mixed-signal test systems.

• Automated Testing:

• Used in automated test systems to improve testing efficiency.